✦ LIBER ✦
A Solution Toward the OFF-State Degradation in Drain-Extended MOS Device
✍ Scribed by Shrivastava, M.; Jain, R.; Baghini, M.S.; Gossner, H.; Rao, V.R.
- Book ID
- 114620234
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 417 KB
- Volume
- 57
- Category
- Article
- ISSN
- 0018-9383
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