✦ LIBER ✦
A soft-error-immune 0.9-ns 1.15-Mb ECL-CMOS SRAM with 30-ps 120 k logic gates and on-chip test circuitry
✍ Scribed by Higeta, K.; Usami, M.; Ohayashi, M.; Fujimura, Y.; Nishiyama, M.; Isomura, S.; Yamaguchi, K.; Idei, Y.; Nambu, H.; Ohhata, K.; Hanta, N.
- Book ID
- 119774620
- Publisher
- IEEE
- Year
- 1996
- Tongue
- English
- Weight
- 930 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0018-9200
- DOI
- 10.1109/4.540054
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