A small and compact AMS facility for tritium depth profiling

✍ Scribed by M Friedrich; W Pilz; N Bekris; M Glugla; M Kiisk; V Liechtenstein

• Book ID: 113823146
• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 349 KB
• Volume: 223-224
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2004.04.008