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A six-circle diffractometer system for synchrotron X-ray studies of surfaces and thin film growth by molecular beam epitaxy

✍ Scribed by Hawoong Hong; T.-C. Chiang


Book ID
108220003
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
733 KB
Volume
572
Category
Article
ISSN
0168-9002

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