A single-photon fault-detection method for nanocircuits that use GaN material

✍ Scribed by Pan, ZhongLiang; Chen, Ling; Zhang, GuangZhao; Wu, PeiHeng

• Book ID: 121551776
• Publisher: SP Science China Press
• Year: 2014
• Tongue: English
• Weight: 584 KB
• Volume: 57
• Category: Article
• ISSN: 1006-9321
• DOI: 10.1007/s11431-014-5463-y