✦ LIBER ✦
A simulation model for electromigration in fine-line metallization of integrated circuits due to repetitive pulsed currents
✍ Scribed by Harrison, J.W., Jr.
- Book ID
- 114538348
- Publisher
- IEEE
- Year
- 1988
- Tongue
- English
- Weight
- 870 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0018-9383
- DOI
- 10.1109/16.8791
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