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A simulation model for dielectric relaxation based on defect diffusion model and waiting time problems

✍ Scribed by Sıtkı Eker; Süleyman Bozdemir

Book ID: 116671879
Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 218 KB
Volume: 356
Category: Article
ISSN: 0022-3093
DOI: 10.1016/j.jnoncrysol.2009.06.044

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