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A SIMS depth profiling study of the hydration layer formed at polycrystalline tin oxide surfaces by atmospheric exposure

✍ Scribed by David F. Cox; Gar B. Hoflund; William H. Hocking


Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
496 KB
Volume
26
Category
Article
ISSN
0169-4332

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