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A simplified criterion for the reliability of a powder pattern indexing

✍ Scribed by de Wolff, P. M. (author)

Book ID
114497502
Publisher
International Union of Crystallography (IUCr)
Year
1968
Tongue
English
Weight
643 KB
Volume
1
Category
Article
ISSN
0021-8898

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## Abstract X‐ray diffraction is a powerful technique for investigating the structure of crystals and crystalline powders. Unfortunately, for powders, the first step in the structure elucidation process, retrieving the unit cell parameters (indexing), is still very critical. In the present article,