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A simple soft X-ray (1 < λ < 11 nm) spectrometer for relative line intensity measurements in charge exchange studies

✍ Scribed by A. Fleury; J. Debernardi; M. Bonnefoy; S. Bliman; J.J. Bonnet; M. Chassevent


Book ID
113277989
Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
681 KB
Volume
14
Category
Article
ISSN
0168-583X

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