✦ LIBER ✦
A simple model for boron trapping by He implantation extended defects in Si: the role of boron diffusivity
✍ Scribed by F. Cayrel; D. Alquier; D. Mathiot; L. Ventura; L. Vincent; G. Gaudin; R. Jérisian
- Book ID
- 113822696
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 404 KB
- Volume
- 216
- Category
- Article
- ISSN
- 0168-583X
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