A simple method to determine segregation coefficients for impurities in pulsed-laser annealed silicon

✍ Scribed by H.S. Tan; C.K. Ong; S.C. Ng

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 205 KB
• Volume: 94
• Category: Article
• ISSN: 0375-9601
• DOI: 10.1016/0375-9601(83)90374-2