A simple closed-form expression for the X-ray reflectivity from multilayers with cumulative roughness

✍ Scribed by David M. Kelly; Eric E. Fullerton; Jacobo Santa-Maria; Ivan K. Schuller

• Book ID: 119178691
• Publisher: Elsevier Science
• Year: 1995
• Weight: 418 KB
• Volume: 33
• Category: Article
• ISSN: 0956-716X
• DOI: 10.1016/0956-716x(95)00391-8