A simple C-V method for measuring minority lifetime of nonuniformly doped MOS structures

✍ Scribed by Qing-An Huang; Bao-Hua Shi; Ying Gu; De-Sheng Zhang

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 163 KB
• Volume: 34
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(91)90173-v