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A shewhart-like charting technique for high yield processes

โœ Scribed by W. Xie; M. Xie; T. N. Goh


Book ID
112185065
Publisher
John Wiley and Sons
Year
1995
Tongue
English
Weight
611 KB
Volume
11
Category
Article
ISSN
0748-8017

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A modified geometric model is proposed for fitting data generated from a process where most of the samples are conforming and occasional samples are non-conforming. These near-zero-defect processes are classified as processes subjected to random shocks. A graphical comparison of the goodness of fit