A series solution approach to an analytical load-deflection relation for the measurement of mechanical properties of thin films

✍ Scribed by Loy, C T; Pradhan, S C; Ng, T Y; Lam, K Y

• Book ID: 120304666
• Publisher: Institute of Physics
• Year: 1999
• Tongue: English
• Weight: 107 KB
• Volume: 9
• Category: Article
• ISSN: 0960-1317
• DOI: 10.1088/0960-1317/9/4/309