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A sensitive method for detecting long-range strain in nearly perfect crystals using X-ray dynamical diffraction

✍ Scribed by Saka, Takashi


Book ID
105364369
Publisher
John Wiley and Sons
Year
2007
Tongue
English
Weight
516 KB
Volume
204
Category
Article
ISSN
0031-8965

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✦ Synopsis


Abstract

A very sensitive method is proposed for the detection of long‐range strain in otherwise perfect crystalline materials. In this method, the specimen is rotated around the scattering vector in the symmetrical Laue case. Long‐range strains due to a uniform bending or torsion, that are not detectable with the symmetrical Laue condition, are sensitively detected by the proposed method of rotating the specimen. Several demonstrative topographic observations are presented. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)