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A scheme on automated test data generation and its evaluation

✍ Scribed by Chen, Ji-feng ;Zhu, Li ;Shen, Jun-yi ;Wang, Zhi-hai


Book ID
107506501
Publisher
Chinese Electronic Periodical Services
Year
2006
Tongue
English
Weight
452 KB
Volume
13
Category
Article
ISSN
1005-9784

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A scheme of test data compression based
✍ Wenfa Zhan; Huaguo Liang; Cuiyun Jiang; Zhengfeng Huang; Aiman El-Maleh πŸ“‚ Article πŸ“… 2010 πŸ› Elsevier Science 🌐 English βš– 369 KB

A new scheme of test data compression/decompression, namely coding of even bits marking and selective output inversion, is presented. It first uses a special kind of codewords, odd bits of which are used to represent the length of runs and even bits of which are used to represent whether the codewor