𝔖 Bobbio Scriptorium
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A scanning probe microscope for studying electron transport at low temperatures

✍ Scribed by A. A. Zhukov

Book ID
110167524
Publisher
Springer
Year
2008
Tongue
English
Weight
254 KB
Volume
51
Category
Article
ISSN
0020-4412

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In nanoprobing measurements the quality of the electrical contact strongly depends on the contact force. Probing semiconductors such as silicon requires applying very high and stable forces to establish an ohmic contact between the probe tip and the structure under study. Therefore, a compact force