A scanning-electron- or light-beam-induced current method for determination of grain boundary recombination velocity in polycrystalline semiconductors

✍ Scribed by Dimitriadis, C.A.

• Book ID: 114595263
• Publisher: IEEE
• Year: 1985
• Tongue: English
• Weight: 484 KB
• Volume: 32
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1985.22193