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A scanned-angle and scanned-energy photoelectron diffraction study of (√3 × √3) R30° Ag on Si(111)

✍ Scribed by G.S. Herman; E.L. Bullock; M. Yamada; A.P. Kaduwela; D.J. Friedman; S. Thevuthasan; Y.J. Kim; T.T. Iran; C.S. Fadley; Th. Lindner; D.E. Ricken; A.W. Robinson; A.M. Bradshaw

Publisher: Elsevier Science
Year: 1993
Weight: 74 KB
Volume: 284
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(93)90972-l

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