A REM study of inhomogeneous stress fields induced by the interfacial steps at In0.2Ga0.8As/GaAs interface

✍ Scribed by Jian Jiang; Xiaochuan Zhou; Anyan Du; L.-M. Peng; Enge Wang; Shanming Mu; Zhantian Zhong

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 252 KB
• Volume: 13
• Category: Article
• ISSN: 0749-6036
• DOI: 10.1006/spmi.1993.1074