A reliability test-plan for series systems with components having stochastic failure rates
โ Scribed by Nair, J.H.; Sabnis, S.V.
- Book ID
- 114555970
- Publisher
- IEEE
- Year
- 2002
- Tongue
- English
- Weight
- 278 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0018-9529
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
The maximum likelihood estimator (MLE) for a distribution function with increasing failure rate is derived, based on a collection of series system data. Applications can arise in industries where operating environments make available only such system-level data, due to system configuration or type-I
One approach to evaluating system reliability is the use of system based component test plans. Such plans have numerous advantages over complete system level tests, primarily in terms of time and cost savings. This paper considers one of the two basic building blocks of many complex systems, namely