A relationship between interface trap density and transconductance in 6HSiC enhancement mode field-effect transistors

✍ Scribed by M.W. Dryfuse; M. Tabib-Azar

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 506 KB
• Volume: 39
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(96)00035-4