✦ LIBER ✦
A reinvestigation of Ni2Si thin film growth on Si(111) by TEM and RBS. Evidence of the presence of an interfacial NiSi layer prior to Ni consumption
✍ Scribed by Mattheis, R. ;Hesse, D.
- Publisher
- John Wiley and Sons
- Year
- 1988
- Tongue
- English
- Weight
- 1021 KB
- Volume
- 109
- Category
- Article
- ISSN
- 0031-8965
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