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A real-time intelligent multiple fault diagnostic system

✍ Scribed by Yong-Hwan Bae; Seok-Hee Lee; Ho-Chan Kim; Byung-Ryong Lee; Jaejin Jang; Jay Lee

Book ID: 105851655
Publisher: Springer
Year: 2005
Tongue: English
Weight: 563 KB
Volume: 29
Category: Article
ISSN: 0268-3768
DOI: 10.1007/s00170-005-2614-0

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