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A rapid method for measuring the transfer impedance of connectors

โœ Scribed by van Horck, F.B.M.; van Deursen, A.P.J.; van der Laan, P.C.T.; Bruins, P.R.; Paagmans, B.L.F.

Book ID
114534104
Publisher
IEEE
Year
1998
Tongue
English
Weight
200 KB
Volume
40
Category
Article
ISSN
0018-9375

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โœ T. M. Benson; C. F. Cheng; P. A. Cudd ๐Ÿ“‚ Article ๐Ÿ“… 1996 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 328 KB ๐Ÿ‘ 2 views

A new simple method for the in situ measurement of the surface transfer impedance of coaxial cables i s described. The method is based on injecting a disturbing current onto the outside of the test cable and measuring the corresponding uoltage induced on the center conductor. It is shown to produce