X-ray diffraction study of a Bi4Ge3O12 c
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T.I. Milenov; P.M. Rafailov; R. Petrova; Yu.F. Kargin; M.M. Gospodinov
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Article
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2007
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Elsevier Science
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English
⚖ 857 KB
A Czochralski grown Bi 4 Ge 3 O 12 crystal plate of (BGO) was examined by several X-ray diffraction methods. The crystal structure, lattice parameter and the atomic positions were determined by single crystal X-ray diffractometry. The X-ray diffraction double crystal traverse topography (XRDT) image