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A Raman study of Bi4(GexSi1−x)3O12 crystals

✍ Scribed by P. Beneventi; D. Bersani; P.P. Lottici; L. Kovács


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
363 KB
Volume
93
Category
Article
ISSN
0038-1098

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X-ray diffraction study of a Bi4Ge3O12 c
✍ T.I. Milenov; P.M. Rafailov; R. Petrova; Yu.F. Kargin; M.M. Gospodinov 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 857 KB

A Czochralski grown Bi 4 Ge 3 O 12 crystal plate of (BGO) was examined by several X-ray diffraction methods. The crystal structure, lattice parameter and the atomic positions were determined by single crystal X-ray diffractometry. The X-ray diffraction double crystal traverse topography (XRDT) image