A radiation-hardened-by-design technique for improving single-event transient tolerance of charge pumps in PLLs

✍ Scribed by Zhenyu, Zhao; Minxuan, Zhang; Shuming, Chen; Jihua, Chen; Junfeng, Li

• Book ID: 120543807
• Publisher: IOP Publishing
• Year: 2009
• Tongue: English
• Weight: 978 KB
• Volume: 30
• Category: Article
• ISSN: 1674-4926
• DOI: 10.1088/1674-4926/30/12/125009