In nanoprobing measurements the quality of the electrical contact strongly depends on the contact force. Probing semiconductors such as silicon requires applying very high and stable forces to establish an ohmic contact between the probe tip and the structure under study. Therefore, a compact force
A radial mirror analyzer for scanning electron/ion microscopes
β Scribed by Hung Quang Hoang; Anjam Khursheed
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 772 KB
- Volume
- 635
- Category
- Article
- ISSN
- 0168-9002
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β¦ Synopsis
This paper presents a high-resolution transmittance electron energy analyzer suitable for use as an attachment inside the specimen chambers of scanning electron/ion microscopes. The analyzer uses a rotationally symmetric electric field distribution to transport electrons/ions emitted from a central point source in a radial direction on to a ring-shaped collection/detection area. The analyzer is designed to fit around a conical shaped objective lens pole-piece/electrode, allowing for a relatively short minimum working distance, 5 mm or less. Simulation results for the analyzer design predict that it will have a relative energy resolution of 0.025% for an entrance angular spread of 7 61, around an order of magnitude better then the well-known Cylindrical Mirror Analyzer (CMA). The analyzer design allows for a parallel mode of operation in which the energy bandwidth on a conical shaped detection plane is predicted to be as high as 32% (7 16%) of the central-band energy. On a flat ring-shaped detection plane, the energy bandwidth is predicted to be around 12% (7 6%) of the central-band energy, over which the simulated relative energy resolution remains below 0.06% for angular spreads of 7 61.
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