𝔖 Bobbio Scriptorium
✦   LIBER   ✦

A quantitative stress-related model for the evolution of the pore size in porous silicon during high temperature annealing

✍ Scribed by Moustafa M. Hassan; Moustafa Y. Ghannam; Jef Poortmans; Robert Mertens


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
769 KB
Volume
253
Category
Article
ISSN
0168-583X

No coin nor oath required. For personal study only.