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A quantitative method for determination of carrier escape efficiency in GaN-based light-emitting diodes: A comparison of open- and short-circuit photoluminescence

✍ Scribed by Lim, Seung-Hyuk; Ko, Young-Ho; Cho, Yong-Hoon


Book ID
121527759
Publisher
American Institute of Physics
Year
2014
Tongue
English
Weight
854 KB
Volume
104
Category
Article
ISSN
0003-6951

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