A quantitative explanation of low-energy tailing features of Si(Li) and Ge X-ray detectors, using synchrotron radiation

✍ Scribed by J.L. Campbell; G. Cauchon; M.-C. Lépy; L. McDonald; J. Plagnard; P. Stemmler; W.J. Teesdale; G. White

• Book ID: 108415104
• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 174 KB
• Volume: 418
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/s0168-9002(98)00889-4