A quantile–quantile plot based pattern matching for defect detection

✍ Scribed by Du-Ming Tsai; Cheng-Hsiang Yang

• Book ID: 108234751
• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 792 KB
• Volume: 26
• Category: Article
• ISSN: 0167-8655
• DOI: 10.1016/j.patrec.2005.02.002