A proposed modular imaging system for photoelectron and electron probe microscopy with aberration correction, and for mirror microscopy and low-energy electron microscopy

✍ Scribed by Walter P. Skoczylas; Gertrude F. Rempfer; O. Hayes Griffith

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 939 KB
• Volume: 36
• Category: Article
• ISSN: 0304-3991
• DOI: 10.1016/0304-3991(91)90154-x