✦ LIBER ✦
A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment
✍ Scribed by Pease, R.L.; Cohn, L.M.; Fleetwood, D.M.; Gehlhausen, M.A.; Turflinger, T.L.; Brown, D.B.; Johnston, A.H.
- Book ID
- 119957831
- Publisher
- IEEE
- Year
- 1997
- Tongue
- English
- Weight
- 909 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0018-9499
No coin nor oath required. For personal study only.