✦ LIBER ✦
A Program Disturb Model and Channel Leakage Current Study for Sub-20 nm nand Flash Cells
✍ Scribed by Torsi, A.; Yijie Zhao; Haitao Liu; Tanzawa, T.; Goda, A.; Kalavade, P.; Parat, K.
- Book ID
- 114620251
- Publisher
- IEEE
- Year
- 2011
- Tongue
- English
- Weight
- 917 KB
- Volume
- 58
- Category
- Article
- ISSN
- 0018-9383
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