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A procedure for multimicroprocessor system testing during development

✍ Scribed by Borivoje Furht; Dragutin Petković

Publisher
Elsevier Science
Year
1981
Tongue
English
Weight
371 KB
Volume
5
Category
Article
ISSN
0141-9331

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## a b s t r a c t Only a few works on fatigue behavior of thin films under tension-tension loading can be found because of some limitations of a testing system. In this study, a fatigue testing system capable of performing load controlled tension-tension fatigue tests even for ductile thin films