✦ LIBER ✦
A “Probe-Lift” MOS-Capacitor Technique for Measuring Very Low Oxide Leakage Currents and Their Effect on Generation Lifetime Extraction
✍ Scribed by Marinella, M.J.; Schroder, D.K.; Chung, G.Y.; Loboda, M.J.; Isaacs-Smith, T.; Williams, J.R.
- Book ID
- 114619067
- Publisher
- IEEE
- Year
- 2008
- Tongue
- English
- Weight
- 642 KB
- Volume
- 55
- Category
- Article
- ISSN
- 0018-9383
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