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A probabilistic approach to evaluate the reliability of piezoelectric micro-actuators

✍ Scribed by Zhimin He; Han Tong Loh; Eng Hong Ong


Book ID
114668349
Publisher
IEEE
Year
2005
Tongue
English
Weight
428 KB
Volume
54
Category
Article
ISSN
0018-9529

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✍ Zhimin He; Han Tong Loh; Min Xie πŸ“‚ Article πŸ“… 2007 πŸ› Elsevier Science 🌐 English βš– 566 KB

In this paper, a probabilistic approach is presented for the evaluation of the reliability of piezoelectric micro-actuators that takes into account the effects of both driving voltage and temperature. Based on the relationships between the lifetime and degradation mechanism of piezoelectric actuator