A Preliminary Study on In-process Monitoring of Finish in Surface Grinding by Chip Radiation Measurement: B. Rajmohan, V. Radhakrishnan, Proceedings of 2nd IMEKO TC14 International Symposium on Metrology for Quality Control in Production, Beijing, China, 9–12 May 1989. pp. 97–103. Int. Acad. Publishers. Beijing, China

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 147 KB
• Volume: 13
• Category: Article
• ISSN: 0141-6359
• DOI: 10.1016/0141-6359(91)90608-l