✦ LIBER ✦
A Practical Model Assessing the Degradation of Polycrystalline Silicon TFTs Due to DC Electrical Stress
✍ Scribed by Kontogiannopoulos, G.P.; Farmakis, F.V.; Kouvatsos, D.N.; Papaioannou, G.J.; Voutsas, A.T.
- Book ID
- 114619988
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 559 KB
- Volume
- 57
- Category
- Article
- ISSN
- 0018-9383
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