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A practical approach to the periodic continuation method for the simulation of high resolution TEM images of isolated crystal defects

✍ Scribed by H. Matsuhata; D. Van Dyck; J. Van Landuyt; S. Amelinckx


Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
600 KB
Volume
13
Category
Article
ISSN
0304-3991

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