A point-by-point multiple sweep numerical algorithm for dopant profiling based on C-V data: X. H. Fu and J. N. Chen. Solid-St. Electron. 35, 181 (1992)

• Book ID: 103285837
• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 136 KB
• Volume: 32
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(92)90319-g