A pilot investigation comparing low-energy, double pass 1,450 nm laser treatment of acne to conventional single-pass, high-energy treatment
✍ Scribed by Eric F. Bernstein
- Publisher
- John Wiley and Sons
- Year
- 2007
- Tongue
- English
- Weight
- 203 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0196-8092
No coin nor oath required. For personal study only.
✦ Synopsis
Abstract
Background and Objectives
Laser treatment using a 1,450 nm diode laser has been shown to improve acne and acne scarring. Its widespread adoption in younger populations has been significantly limited by discomfort.
Study Design/Materials and Methods
Six subjects with active papular acne were treated in a pilot study to determine parameters for a split‐face, double‐pass, low‐energy protocol of 1,450 nm laser treatment. Sides of the face were randomized to receive single‐pass, high‐energy treatment (13–14 J/cm^2^), or double‐pass, low energy treatment (8–11 J/cm^2^), for a total of four treatments delivered at monthly intervals. Acne counts and standardized, digital photograph were performed 2 months following the final treatment, and compared to pre‐treatment counts and photographs.
Results
Improvement was evaluated comparing pre‐ and post‐treatment photos and averaged 2.5 for the high‐energy, single‐pass side and 2.3 for the low‐energy, double‐pass side, using a 0 (worse) to 4 (max improvement) scale. Acne counts were reduced 78% on the high‐energy, single‐pass side and 67% on the low‐energy, double‐pass side. Pain ratings on a 1 (min) to 10 (max) scale averaged 5.6 (range 1–9) for the high‐energy, single‐pass side and 1.3 (range 1–2) for the low‐energy, double‐pass side.
Conclusions
Low‐energy, double‐pass 1,450 nm laser treatment effectively reduces acne counts 2 months post‐treatment, and dramatically reduces the pain associated with treatment. The treatment parameters used in this study have eliminated the need for anesthetic cream in daily practice. Lasers Surg. Med. 39:193–198, 2007. © 2007 Wiley‐Liss, Inc.