A physically-based semi-empirical series resistance model for deep-submicron MOSFET I-V modeling

✍ Scribed by Lim, K.Y.; Zhou, X.

• Book ID: 114538194
• Publisher: IEEE
• Year: 2000
• Tongue: English
• Weight: 117 KB
• Volume: 47
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.842978