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A physically based relation between extracted threshold voltage and surface potential flat band voltage for MOSFET compact modeling

✍ Scribed by Benson, J.; D'Halleweyn, N.V.; Redman-White, W.; Easson, C.A.; Uren, M.J.; Faynot, O.; Pelloie, J.-L.


Book ID
114538675
Publisher
IEEE
Year
2001
Tongue
English
Weight
73 KB
Volume
48
Category
Article
ISSN
0018-9383

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