✦ LIBER ✦
A physically based relation between extracted threshold voltage and surface potential flat band voltage for MOSFET compact modeling
✍ Scribed by Benson, J.; D'Halleweyn, N.V.; Redman-White, W.; Easson, C.A.; Uren, M.J.; Faynot, O.; Pelloie, J.-L.
- Book ID
- 114538675
- Publisher
- IEEE
- Year
- 2001
- Tongue
- English
- Weight
- 73 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0018-9383
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