A phase sensitive technique for the study of noise properties of HTS junctions

✍ Scribed by S.G. Hammond; Y. He; C.M. Muirhead; M.S. Colclough; K. Char

• Book ID: 103056444
• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 374 KB
• Volume: 32
• Category: Article
• ISSN: 0011-2275
• DOI: 10.1016/0011-2275(92)90282-f

✦ Synopsis

We report a phase sensitive technique for measuring the voltage noise of junctions which enables us easily to separate out the low frequency 1/f noise component due to critical current fluctuations. We illustrate this technique with detailed voltage noise measurements in three junctions grown by a biepitaxial process. We also provide evidence that these fluctuations are not due to motion of magnetic flux in or near to the junction.