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A percolation study of RTS noise amplitudes in nano-MOSFETs by Monte Carlo simulation

โœ Scribed by Ma Zhongfa; Zhang Peng; Wu Yong; Li Weihua; Zhuang Yiqi; Du Lei

Book ID
108210840
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
462 KB
Volume
50
Category
Article
ISSN
0026-2714

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