Local p-type conductivity in n-GaN and n
โ
A. Krtschil; D.C. Look; Z.-Q. Fang; A. Dadgar; A. Diez; A. Krost
๐
Article
๐
2006
๐
Elsevier Science
๐
English
โ 234 KB
We report on scanning capacitance microscopy (SCM) investigations of Fe-doped GaN and nitrogen-doped ZnO layers. Macroscopically, these samples electrically behave in conventional I-V and C-V measurements like semi-insulating or n-type material, respectively. However, in SCM we found local p-type re